silicon planar epitaxial pn p transistor semelab limited reserves the right to change test c onditions, parameter limits and package dimensions without notice. information furnished by semelab is believed to be both accurate and reliable at the time of going to press. however semelab assumes no responsibility for any errors or omissions discovered in its use. semelab encourage s customers to verify that datasheets are current before placing o rders. semelab limited semelab limited semelab limited semelab limited coventry road, lutterworth, leicestershire, le17 4 jb telephone +44 (0) 1455 556565 fax +44 (0) 1455 5526 12 email: sales@semelab-tt.com website: http://www.semelab-tt.com document number 8357 issue 1 page 1 of 4 2N2907AC3 low power, high speed saturated switching hermetic surface mounted package. ideally suited for high speed switching and general purpose applications screening options available absolute maximum ratings (t a = 25c unless otherwise stated) v cbo collector ? base voltage -60v v ceo collector ? emitter voltage -60v v ebo emitter ? base voltage -5v i c continuous collector current -600ma p d total power dissipation at t a = 25c 500mw derate above 37.5c 3.08mw/c t j junction temperature range -65 to +200c t stg storage temperature range -65 to +200c thermal properties (each device) symbols parameters min. typ. max. units r ja thermal resistance, junction to ambient 325 c/w
silicon planar epitaxial pn p transistor 2N2907AC3 semelab limited semelab limited semelab limited semelab limited coventry road, lutterworth, leicestershire, le17 4 jb telephone +44 (0) 1455 556565 fax +44 (0) 1455 5526 12 email: sales@semelab-tt.com website: http://www.semelab-tt.com document number 8357 issue 1 page 2 of 4 electrical characteristics (t a = 25c unless otherwise stated) symbols parameters test conditions min. typ max. units v (br)ceo (1) collector-emitter breakdown voltage i c = -10ma i b = 0 -60 v v cb = -60v i e = 0 -10 a v cb = -50v i e = 0 -10 na i cbo collector cut-off current t a = 150c -10 a v eb = -5v i c = 0 -10 a i ebo emitter cut-off current v eb = -4v i c = 0 -50 na i ces collector cut-off current v ce = -50v -50 na i c = -150ma i b = -15ma -0.4 v ce(sat) (1) collector-emitter saturation voltage i c = -500ma i b = -50ma -1.6 i c = -150ma i b = -15ma -0.6 -1.3 v be(sat) (1) base-emitter saturation voltage i c = -500ma i b = -50ma -2.6 v i c = -0.1ma v ce = -10v 75 i c = -1.0ma v ce = -10v 100 450 i c = -10ma v ce = -10v 100 t a = -55c 50 i c = -150ma v ce = -10v 100 300 h fe (1) forward-current transfer ratio i c = -500ma v ce = -10v 50 dynamic characteristics i c = -20ma v ce = -20v | h fe | small signal forward-current transfer ratio f = 100mhz 2 i c = -1.0ma v ce = -10v h fe small signal current gain f = 1.0khz 100 v cb = -10v i e = 0 c obo output capacitance f = 1.0mhz 8 v eb = -2v i c = 0 c ibo input capacitance f = 1.0mhz 30 pf i c = -150ma v cc = -30v t on turn-on time i b1 = -15ma 45 i c = -150ma v cc = -30v t off turn-off time i b1 = - i b2 = -15ma 300 ns notes notes notes notes (1) pulse width 300us, 2%
silicon planar epitaxial pn p transistor 2N2907AC3 semelab limited semelab limited semelab limited semelab limited coventry road, lutterworth, leicestershire, le17 4 jb telephone +44 (0) 1455 556565 fax +44 (0) 1455 5526 12 email: sales@semelab-tt.com website: http://www.semelab-tt.com document number 8357 issue 1 page 3 of 4 mechanical data dimensions in mm (inches) c3 (mo-041ba) underside view package variant table variant pad 1 pad 2 pad 3 pad 4 a collector n/c emitter base b collector n/c base emitter c collector emitter n/c base n/c = no connection 1 2 34 5.59 0.13 (0.22 0.005) 0.23 (0.009) rad. 1.02 0.20 (0.04 0.008) 2.03 0.20 (0.08 0.008) 1.40 0.15 (0.055 0.006) 0.25 0.03 (0.01 0.001) 0.23 (0.009) min. 1 . 27 0 . 05 ( 0 . 05 0 . 002 ) 3 . 81 0 . 13 ( 0 . 15 0 . 005 ) 0 . 64 0 . 08 ( 0 . 025 0 . 003 )
silicon planar epitaxial pn p transistor 2N2907AC3 semelab limited semelab limited semelab limited semelab limited coventry road, lutterworth, leicestershire, le17 4 jb telephone +44 (0) 1455 556565 fax +44 (0) 1455 5526 12 email: sales@semelab-tt.com website: http://www.semelab-tt.com document number 8357 issue 1 page 4 of 4 screening options space level (jqrs/esa) and high reliability options a re available in accordance with the high reliability and screening options handbook available for download from the from the tt electronics semelab web site. esa quality level products are based on the testing procedures specified in the generic escc 5000 and in the corresponding part detail specifications. semelabs qr216 and qr217 processing specifications (jqrs), in conjunction with the companies iso 9001: 2000 approval present a viable alternative to the america n mil- prf-19500 space level processing. qr217 (space level quality conformance) is based on the quality conformance inspection requirements of mil- prf- 19500 groups a (table v), b (table via), c (table vi i) and also esa / escc 5000 (chart f4) lot validation tests. qr216 (space level screening) is based on the scree ning requirements of mil-prf-19500 (table iv) and also e sa /escc 5000 (chart f3). jqrs parts are processed to the device data sheet a nd screened to qr216 with conformance testing to q217 groups a and b in accordance with mil-std-750 method s and procedures. additional conformance options are available, for ex ample pre-cap visual inspection, buy-off visit or data pac ks. these are chargeable and must be specified at the o rder stage (see ordering information). minimum order quantities may apply. alternative or additional customer specific conforma nce or screening requirements would be considered. contact semelab sales with enquires. marking details parts are typically marked with specification numbe r, serial number (or week of seal) as shown in the example be low. . customer specific marking requirements can be arrang ed at time of order but is approximately limited to three lines of 7 characters. this is to ensure text remains readabl e. example marking: ordering information part number is built from part, package variant and screening level. the part number can be extended to include the additional options as shown below. type ? see electrical stability characteristics tab le package variant ? see mechanical data screening level ? see screening options (esa / jqrs) additional options: customer pre-cap visual inspection .cvp customer buy-off visit .cvb data pack .da solderability samples .ss scanning electron microscopy .sem radiography (x-ray) .xray total dose radiation test .rad mil-prf-19500 (qr217) group b charge .grpb group b destructive mechanical samples .gbdm (12 pi eces) group c charge .grpc group c destructive electrical samples .gcde (12 pi eces) group c destructive mechanical samples .gcdm (6 pie ces) esa/escc lot validation testing (subgroup 1) charge .lvt1 lvt1 destructive samples (environmental) .l1de (15 pieces) lvt1 destructive samples (mechanical) .l1dm (15 pie ces) lot validation testing (subgroup 2) charge .lvt2 lvt2 endurance samples (electrical) .l2d (15 pieces ) lot validation testing (subgroup 3) charge .lvt3 lvt3 destructive samples (mechanical) .l3d (5 piece s) additional option notes: 1) all ?additional options? are chargeable and must be specified at order stage. 2) when group b,c or lvt is required, additional el ectrical and mechanical destructive samples must be ordered 3) all destructive samples are marked the same as o ther production parts unless otherwise requested. example ordering information: the following example is for the 2N2907AC3 part, packa ge variant b, jqrs screening, additional group c confor mance testing and a data pack. part numbers: 2N2907AC3b-jqrs (include quantity for flight parts) 2N2907AC3b-jqrs.grpc (chargeable conformance option) 2N2907AC3b-jqrs.gcde (charge for destructive parts) 2N2907AC3b-jqrs.gcdm (charge for destructive parts) 2N2907AC3b-jqrs.da (charge for data pack) customers with any specific requirements (e.g. marki ng, package or screening) may be supplied with a simila r alternative part number (there is maximum 20 charac ter limit to part numbers). contact semelab sales with all enquiries high reliability and screening options handbook link : http://www.semelab.co.uk/pdf/misc/documents/hirel_ and_screening_options.pdf
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